KLA-Tencor (KT) is the world-wide leader in yield management and process control solutions for semiconductor manufacturing and related industries. We offer a broad array of products and services for in-line wafer defect monitoring, reticle and photomask defect inspection, electron beam metrology, wafer overlay, film and surface measurement, as well as overall yield and fab-wide data analysis.

Because yield improvement is key to increasing manufacturing productivity and profitability, KLA-Tencor’s market has outperformed the semiconductor capital equipment segment as a whole, and our technology is used by every major semiconductor manufacturer around the world.