From the world's first DualBeam' system, to market-leading scanning electron microscopes, to the world's most powerful, commercially-available transmission electron microscope, FEI's Tools for Nanotech are enabling researchers, scientists, and industrial pioneers to see, analyze, and manipulate two- and three-dimensional nanoscale structures. Our market-leading instruments, which include scanning electron microscopes, transmission electron microscopes, Dualbeam' systems, and focused ion beam tools, push the boundaries of discovery and exploration, facilitating breakthroughs in pharmacology, biotechnology, forensics, pathology, materials science, semiconductor manufacturing and data storage.

FEI's product families push the boundaries of nanoscale imaging and discovery, enabling researchers and manufacturers to perform work more quickly, more precisely and more easily. Designed with a focus on the nanotechnology needs of key business segments, models within families include different features, providing a range of capabilities.

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